Scintillation yield in high pressure xenon and xenon doped with methane

Author

Pushkin, K.N. ; Hasebe, N. ; Kobayashi, S. ; Tezuka, C. ; Mimura, M. ; Hosojima, T. ; Kobayashi, M.-N. ; Doke, T. ; Miyajima, M. ; Miyachi, T. ; Shibamura, E. ; Ulin, S.E. ; Dmitrenko, V.V.

Author_Institution

Adv. Res. Inst. for Sci. & Eng., Waseda Univ., Tokyo, Japan

Volume

1

fYear

2004

fDate

16-22 Oct. 2004

Firstpage

550

Abstract

Scintillation light and ionization yields in pure xenon and xenon doped with various concentration of methane (0.2-2%) have been measured as a function of the reduced electric field (E/N) from 0 to 4×10^-18 Vcm² at a pressure of 2.6 MPa. The measurements of photons and electrons have been made in gaseous xenon excited by ²⁴¹Am alpha particles. High purity xenon was used to fill a high-pressure xenon chamber equipped with MgF₂ window coupled to a photomultiplier tube (PMT). The scintillation light in xenon-methane mixture is observed to decrease as the concentration of methane increases.

Keywords

gas scintillation detectors; ionisation chambers; photomultipliers; 2.6 MPa; ²⁴¹Am alpha particles; MgF₂ window; gaseous xenon; high-pressure xenon chamber; ionization yields; methane-doped xenon; photomultiplier tube; reduced electric field; scintillation light; scintillation yield; xenon-methane mixture; Alpha particles; Anodes; Electric variables measurement; Electrons; Particle measurements; Photomultipliers; Pressure measurement; Solid scintillation detectors; Wires; Xenon;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2004 IEEE

ISSN

1082-3654

Print_ISBN

0-7803-8700-7

Electronic_ISBN

1082-3654

Type

conf

DOI

10.1109/NSSMIC.2004.1462255

Filename

1462255