DocumentCode :
437804
Title :
Ultra-low background alpha particle counter using pulse shape analysis
Author :
Warburton, W.K. ; Dwyer-McNally, Brendan ; Momayezi, Michael ; Wahl, John E.
Author_Institution :
X-ray Instrum. Associates, Newark, CA, USA
Volume :
1
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
577
Abstract :
The need to measure alpha particle emissivities at levels below 0.005 α/cm2-hr is becoming increasingly important in fundamental physics experiments (e.g. neutrino and rare decay measurements), environmental monitoring, nuclear activities monitoring and semiconductor packaging materials. Present counters can barely reach this level, being limited both by cosmic ray events and by their own alpha emissions. Here we report a detector capable of measurements at 0.00005 α/cm2-hr using a large electrode ionization chamber with digital pulse shape analysis to locate the point of emission of each alpha particle. Filled with 1 atm N2, the counter is essentially blind to both environmental gamma-rays and cosmic ray muon showers, so its background becomes limited by the ability of the pulse shape analysis to distinguish different points of alpha particle origin. The counter´s geometry intentionally exaggerates differences between signals originating from its different surfaces, with an inter-electrode separation D over 3 times the alpha particle range L. Since signal risetimes equal charge drift times, anode events have 8-10 μs risetimes, while sample event risetimes are 30-35 μs and readily distinguished. Integrated charge also increases with drift length, producing a 2 to 1 difference between sample and anode events. Applying both risetime and amplitude cuts distinguishes between sample and anode emitted alpha particles at about 1 part in 1000. A guard electrode surrounding the anode allows alpha particles from the counter´s sidewalls to be rejected at a similar ratio, so that essentially only alpha particles emanating from the sample are finally counted.
Keywords :
alpha-particle detection; ionisation chambers; 1 atm; 30 to 35 mus; 8 to 10 mus; alpha emissions; alpha particle emissivities; alpha particle origin; amplitude cuts; anode events; charge drift times; cosmic ray events; cosmic ray muon showers; counter geometry; counter sidewalls; digital pulse shape analysis; drift length; electrode ionization chamber; environmental gamma-rays; environmental monitoring; event risetimes; guard electrode; integrated charge; interelectrode separation; neutrino measurements; nuclear activities monitoring; rare decay measurements; semiconductor packaging materials; signal risetimes; ultralow background alpha particle counter; Alpha particles; Anodes; Counting circuits; Electrodes; Monitoring; Nuclear measurements; Particle measurements; Pulse measurements; Pulse shaping methods; Shape measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462261
Filename :
1462261
Link To Document :
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