DocumentCode
437843
Title
Study of neutron pre-irradiated silicon for nuclear detectors
Author
Litovchenko, P.G. ; Bisello, D. ; Litovchenko, A.P. ; Groza, A.A. ; Dolgolenko, A.P. ; Khivrich, V.I. ; Barabash, L.I. ; Lastovetsky, V.F. ; Polivtsev, L.A. ; Khomenkov, V.P. ; Candelori, A. ; Rando, R. ; Wahl, W. ; Wyss, J. ; Boscardin, M. ; Ronchin, S.
Author_Institution
Inst. for Nucl. Res., Ukraine
Volume
2
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
774
Abstract
The ways of increasing the radiation hardness of silicon were considered. It was then experimentally shown that a preliminary irradiation of the bulk silicon introduces sinks for radiation defects that leads to an increased radiation hardness of the silicon. Neutron transmutation doping of silicon can be considered as one form of preliminary radiation. It was shown that for neutron transmutated silicon the carrier removal rate in NTD after γ-irradiation is more than one order of magnitude smaller than in a standard reference specimen, but the carriers removal rate after neutron irradiation is approximately a factor of two less.
Keywords
elemental semiconductors; gamma-ray effects; neutron effects; radiation hardening; semiconductor doping; silicon; bulk silicon; carrier removal rate; gamma-irradiation; neutron irradiation; neutron preirradiated silicon; neutron transmutated silicon; neutron transmutation doping; nuclear detectors; radiation defect sinks; radiation hardness; Annealing; Atomic measurements; Doping; Electromagnetic wave absorption; Infrared spectra; Neutrons; Physics; Radiation detectors; Semiconductor radiation detectors; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1462324
Filename
1462324
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