Title :
Strip interpolation in silicon and germanium strip detectors
Author :
Wulf, Eric A. ; Phlips, Bernard F. ; Johnson, W. Neil ; Kurfess, James D. ; Lister, C.J. ; Kondev, Filip
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
The position resolution of double-sided strip detectors is limited by the strip pitch and a reduction in strip pitch necessitates more electronics. Improved position resolution would improve the imaging capabilities of Compton telescopes and PET detectors. Digitizing the preamplifier waveform yields more information than can be extracted with regular shaping electronics. In addition to the energy, depth of interaction, and which strip was hit, the digitized preamplifier signals can locate the interaction position to less than the strip pitch of the detector by looking at induced signals in neighboring strips. This allows the position of the interaction to be interpolated in three dimensions and improve the imaging capabilities of the system. In a 2 mm thick silicon strip detector with a strip pitch of 0.891 mm, strip interpolation located the interaction of 356 keV gamma rays to 0.3 mm FWHM. In a 2 cm thick germanium detector with a strip pitch of 5 mm, strip interpolation of 356 keV gamma rays yielded a position resolution of 1.5 mm FWHM.
Keywords :
gamma-ray apparatus; gamma-ray detection; germanium radiation detectors; nuclear electronics; position sensitive particle detectors; silicon radiation detectors; 356 keV; Compton telescopes; PET detectors; digitized preamplifier signals; double-sided strip detectors; gamma rays; germanium strip detector; imaging capabilities; induced signals; interaction depth; interaction position; position resolution; preamplifier waveform; shaping electronics; silicon strip detector; strip interpolation; strip pitch; Energy resolution; Gamma ray detection; Gamma ray detectors; Gamma rays; Germanium; Image resolution; Interpolation; Preamplifiers; Silicon; Strips;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1462358