• DocumentCode
    437872
  • Title

    Intrinsic luminescence and luminescence of inadvertent impurities in LuAP and LuYAP crystals

  • Author

    Kamenskikh, I.A. ; Guerassimova, N.V. ; Mikhailin, V.V. ; Vasil´ev, A.N. ; Dujardin, C. ; Pedrini, C. ; Petrosyan, A.G.

  • Author_Institution
    M.V. Lomonosov Moscow State Univ., Russia
  • Volume
    2
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    993
  • Abstract
    To clarify the potential of LuAP:Ce and LuYAP:Ce scintillators of new generation the mechanisms of the energy transfer from the matrix to the cerium ions and competing relaxation channels were investigated using VUV luminescence spectroscopy for the crystals provided by different producers using different growth techniques. With temperature being one of the ways to control the light yield of these crystals, effect of temperature was studied for different excitation energies. Anomalous temperature dependence of the luminescence light yield under VUV excitation was analyzed. New intrinsic luminescence band was observed in all of the crystals and energy transfer from it to cerium ions was demonstrated. New luminescence band in the IR peaking around 750 nm was defected, its origin and effect on the scintillator performance is discussed.
  • Keywords
    impurities; infrared spectra; luminescence; lutetium compounds; scintillation; ultraviolet spectra; yttrium compounds; IR luminescence band; LuAP crystal; LuAP:Ce scintillator; LuAlO3:Ce; LuYAP crystal; LuYAP:Ce scintillator; LuYAlO:Ce; VUV excitation; VUV luminescence spectroscopy; cerium ions; competing relaxation channels; energy transfer; excitation energies; growth techniques; impurities; intrinsic luminescence band; matrix; temperature dependent luminescence light yield; Cerium; Crystals; Energy exchange; Impurities; Kinetic theory; Lighting control; Luminescence; Positron emission tomography; Solid scintillation detectors; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462373
  • Filename
    1462373