• DocumentCode
    437940
  • Title

    A precise cyclic CMOS time-to-digital converter with low thermal sensitivity

  • Author

    Chen, Chun-Chi ; Chang, Wei ; Chen, Poki

  • Author_Institution
    Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • Volume
    3
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    1364
  • Abstract
    In this paper, a precise cyclic CMOS time-to-digital converters (TDC) with low thermal sensitivity is proposed. Through compensation, the thermal sensitivity of the new cyclic time-to-digital converter is reduced dramatically. The proposed TDC possesses not only less thermal-sensitive resolution but also low cost and small chip size. The circuit was fabricated with TSMC 0.35 mum CMOS technology. The size of the circuit is 0.40 mm times 0.30 mm only. The experimental results show that a plusmn6% resolution variation of the new TDC was achieved within 0~100degC temperature range which is much better than plusmn25% of the original uncompensated version. The effective resolution is as fine as 58 ps at room temperature. The measurement rate is 33 kHz, at least.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; 0.30 mm; 0.35 mum; 0.40 mm; 33 kHz; 58 ps; chip size; circuit size; effective resolution; measurement rate; precise cyclic CMOS time-digital converter; thermal sensitivity; thermal-sensitive resolution; CMOS technology; Circuits; Delay lines; Energy consumption; Instruments; Laser theory; Power measurement; Semiconductor device measurement; Size measurement; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • Conference_Location
    Rome
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462495
  • Filename
    1462495