• DocumentCode
    437953
  • Title

    Multichannel data acquisition system based on FPGA for high resolution spectroscopy

  • Author

    Buzzetti, S. ; Capou, M. ; Guazzoni, C. ; Longoni, A. ; Mariani, R. ; Moser, S.

  • Author_Institution
    Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
  • Volume
    3
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    1458
  • Abstract
    A complete four channels acquisition system for high-resolution spectroscopy has been designed and realized. The analogue section is composed of four semi-Gaussian shaping amplifiers with two software-selectable shaping times. The shaping times (150 ns and 450 ns) were chosen to perform either high rate or best resolution XRF measurements with state-of-the-art multi-element silicon drift detectors. The pulse amplitudes are caught by four large-bandwidth peak-stretchers whose outputs are multiplexed into a single 10 MHz 12 bit ADC. An FPGA operating at 24 MHz (or 48 MHz) clock frequency controls the whole process and stores the four spectra in the on-chip RAM, thus guaranteeing a maximum counting rate per bin of 332 kcps and an overall counting rate in excess of 4 Mcps. The system interfaces the host PC by means of the enhanced parallel port with a custom made control software for data visualization and analysis as in a conventional MCA system. If more than four channels have to be managed, various boards can be operated in parallel on the same EPP bus.
  • Keywords
    X-ray detection; X-ray spectrometers; X-ray spectroscopy; amplifiers; data acquisition; drift chambers; field programmable gate arrays; fluorescence; silicon radiation detectors; 10 MHz; 150 ns; 24 MHz; 450 ns; 48 MHz; FPGA; analogue section; best resolution X-ray fluorescence measurements; clock frequency; control software; data visualization; enhanced parallel port bus; four channels acquisition system; high rate X-ray fluorescence measurements; high resolution spectroscopy; host PC; large-bandwidth peak-stretchers; maximum counting rate; multichannel data acquisition system; multielement silicon drift detectors; on-chip RAM; pulse amplitudes; semiGaussian shaping amplifiers; software-selectable shaping times; Clocks; Control systems; Data acquisition; Detectors; Field programmable gate arrays; Frequency control; Performance evaluation; Pulse amplifiers; Silicon; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • Conference_Location
    Rome
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462515
  • Filename
    1462515