DocumentCode
438104
Title
A silicon microstrip system equipped with the RX64DTH ASIC for dual energy mammography
Author
Ramello, L. ; Avila, C. ; Bollini, D. ; Rodriguez, A. E Cabal ; Sanchez, C. Ceballos ; Dabrowski, W. ; Garcia, A. Diaz ; Gambaccini, M. ; Giubellino, P. ; Grybos, P. ; Gaitan, J. Lopez ; Marzari-Chiesa, A. ; Montano, L.M. ; Prino, F. ; Sanabria, J.C. ; Sa
Author_Institution
Dip. Sci. e Tecnologie Avanzate, Univ. del Piemonte Orientale, Alessandria, Italy
Volume
4
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
2324
Abstract
We present results obtained with a single photon counting system of 384 silicon microstrips (100 micron pitch) equipped with six RX64DTH ASICs including charge preamplifier, shaper, two discriminators and two 20-bit counters for each channel. The energy resolution of the system was determined to be of 0.72 keV (rms) with a spread of threshold setting of 0.32 keV for the whole 384-channel module (at energies of 29-33 keV), indicating its excellent potential for dual-energy imaging. Images of a mammographic test object made of PMMA, polyethylene and water were taken in scanning mode (strips parallel to incoming X-rays) under the dual energy X-ray beams. Images were subsequently processed with the dual energy subtraction technique (Alvarez and Macovski, 1976). Experimental results agree well with MCNP simulations of the mammographic phantom and demonstrate the capability of our system to obtain contrast cancellation between two kinds of materials, thereby enhancing the visibility of small features in the third material.
Keywords
X-ray imaging; mammography; phantoms; position sensitive particle detectors; silicon radiation detectors; MCNP simulations; X-ray beams; charge preamplifier; dual energy mammography; dual energy subtraction technique; mammographic phantom; polyethylene; scanning mode; silicon microstrip system; single photon counting system; water; Application specific integrated circuits; Counting circuits; Energy resolution; Mammography; Microstrip; Optical imaging; Preamplifiers; Silicon; Testing; X-rays;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Type
conf
DOI
10.1109/NSSMIC.2004.1462723
Filename
1462723
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