Title :
Role of heat formation on soft magnetic properties and structure of metal-insulator type nano-granular magnetic films
Author :
Ohnuma, S. ; Ohnuma, M. ; Hono, K. ; Fujimori, H. ; Masumoto, T.
Author_Institution :
The Res. Inst. for Electr. & Magnetic Mater., Japan
Abstract :
In this study the magnetic properties and the microstructure of several granular films, which contain the insulating matrix with different magnitude of heat of formation ΔH, were investigated and a guide in obtaining excellent high frequency soft magnetic film was found. Nano-granular films were prepared on glass substrate by Ar+O2 reactive sputtering using Co85ME15 alloy targets (ME: Ge, Sn, Si, Al, Dy, Sm, Y). High resolution transmission electron microscopy and small angle X-ray scattering were used for determination of the film microstructure. Magnetic measurements were conducted on a vibrating sample magnetometer. Results showed that saturation magnetization of Co-ME-O films gradually increased with the magnitude of ΔH of ME-O compound. On the other hand, the electrical resistivity decreased with increasing ΔH of ME-O compound films. These intrinsic factors were attributed to the structure change and segregation of film structure during deposition.
Keywords :
X-ray scattering; cobalt compounds; crystal microstructure; electrical resistivity; granular materials; heat of formation; magnetic thin films; magnetisation; nanostructured materials; segregation; soft magnetic materials; transmission electron microscopy; Co85Al15O; Co85Dy15O; Co85Ge15O; Co85Si15O; Co85Sm15O; Co85Sn15O; Co85Y15O; deposition; electrical resistivity; film microstructure; film structure segregation; heat of formation; high frequency soft magnetic film; high resolution transmission electron microscopy; insulating matrix; intrinsic factors; metal-insulator type nano-granular magnetic film structure; reactive sputtering; saturation magnetization; small angle X-ray scattering; structure change; vibrating sample magnetometer; Frequency; Glass; Insulation; Magnetic films; Magnetic properties; Metal-insulator structures; Microstructure; Semiconductor films; Sputtering; Substrates;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1463457