• DocumentCode
    438359
  • Title

    Switching of magnetostrictive micro-dot arrays by mechanical strain

  • Author

    Bootsmann, M.-T. ; Dokupil, S. ; Quandt, E. ; Ivanov, T. ; Abedinov, N. ; Löhndorf, M.

  • Author_Institution
    Center of Adv. Eur. Studies, Bonn, Germany
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1945
  • Lastpage
    1946
  • Abstract
    CoFeBSi and FeCo magnetostrictive micro-and nano-dot arrays are fabricated on Si3N4 membranes with different diameters (50 to 300 μm) by combining MEMS fabrication processes and thin film technology. Compressive or tensile mechanical strain is introduced in order to observe the inverse magnetostriction effect or the Villary effect. Magnetic force microscopy and MOKE measurements are employed in order to investigate the strain induced switching properties and resolve the domain structure of the amorphous micro- and nano-dot arrays. The local strain distribution of the various membrane structures is obtained by finite-element method. The results of the simulations are then compared to the experimental results.
  • Keywords
    boron alloys; cobalt alloys; compressive strength; finite element analysis; iron alloys; magnetic domains; magnetic force microscopy; magnetic switching; magnetic thin films; magnetostriction; micromechanical devices; nanostructured materials; nanotechnology; noncrystalline structure; silicon alloys; tensile strength; CoFeBSi; FeCo; MEMS fabrication processes; Si3N4; Villary effect; amorphous microdot arrays; compressive strain; domain structure; finite-element method; magnetic force microscopy; magnetization switching; magnetostriction effect; magnetostrictive microdot arrays; magnetostrictive switching; mechanical strain; membrane structures; microdot arrays; nanodot arrays; strain distribution; tensile mechanical strain; thin film technology; Amorphous magnetic materials; Biomembranes; Fabrication; Magnetic field induced strain; Magnetic switching; Magnetostriction; Micromechanical devices; Semiconductor thin films; Strain measurement; Tensile strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464409
  • Filename
    1464409