DocumentCode
438364
Title
Room temperature stability study in silicon base magnetic tunneling transistor
Author
Huang, Y.W. ; Lo, C.K. ; Yao, Y.D. ; Hsieh, L.C. ; Huang, D.R.
Author_Institution
Dept. of Material Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2005
fDate
4-8 April 2005
Firstpage
2005
Lastpage
2006
Abstract
The room temperature stability of a silicon base magnetic tunneling transistor fabricated by a magnetic tunneling junction (MTJ) with a p-n junction barrier prepared on a Si (100) substrate is reported. The collector current and the change of magnetocurrent (MC) at room temperature as a function of magnetic field at the emitter bias is investigated. The collector current varies from 4.2 μA at magnetically parallel state to 2.89 μA at magnetically anti-parallel state. The emitter voltage dependence of emitter currents and the transfer ratio at the parallel state were observed to increase as the emitter voltage (VE) is increased. MC of emitter and base currents decreases as VE goes up while the MC of the collector current reaches a maximum at VE of 1.2 V.
Keywords
elemental semiconductors; magnetic tunnelling; magnetoelectric effects; magnetoelectronics; p-n junctions; silicon; tunnel transistors; 1.2 V; 4.2 to 2.89 muA; MTJ; Si; base currents; collector current; emitter bias; emitter currents; emitter voltage; magnetic tunneling junction; magnetically antiparallel state; magnetically parallel state; magnetocurrent; p-n junction barrier; silicon base magnetic tunneling transistor; Magnetic tunneling; P-n junctions; Polarization; Silicon; Solids; Stability; Temperature dependence; Temperature distribution; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN
0-7803-9009-1
Type
conf
DOI
10.1109/INTMAG.2005.1464441
Filename
1464441
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