DocumentCode :
438370
Title :
Molecular dynamics investigations for thin film growth morphology of Ni/Ni(111)
Author :
Lee, Soon-Gun ; Lee, Kwang-Ryeol ; Chung, Yong-Chae
Author_Institution :
Dept. of Ceramic Eng., Hanyang Univ., Seoul, South Korea
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
2103
Lastpage :
2104
Abstract :
The deposition process of Ni atoms on Ni(111) substrate for various adatom incident energy was intensively investigated by using molecular dynamics (MD) method in order to investigate morphology and quality of thin-film in atomic level. The surface roughness of the system was calculated for 1, 3 and 5 ML deposition of Ni adatom.
Keywords :
adsorbed layers; metallic thin films; molecular dynamics method; nickel; sputter deposition; surface morphology; surface roughness; Ni; adatom deposition; adatom incident energy; molecular dynamics investigations; surface roughness; thin film growth morphology; Atomic layer deposition; Ceramics; Nonhomogeneous media; Rough surfaces; Sputtering; Stress; Substrates; Surface morphology; Surface roughness; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464490
Filename :
1464490
Link To Document :
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