• DocumentCode
    438387
  • Title

    Theoretic analysis and enhanced x-tolerance of test response compact based on convolutional code

  • Author

    Han, Yinhe ; Hu, Yu ; Li, Huawei ; Li, Xiaowei

  • Author_Institution
    Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing, China
  • Volume
    1
  • fYear
    2005
  • fDate
    18-21 Jan. 2005
  • Firstpage
    53
  • Abstract
    This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n-1, m, 3) convolutional code is proposed. Theoretic analysis for this encoder is presented to avoid two and any odd erroneous bit cancellations, handle one unknown bit (X bit) and diagnose one erroneous bit. The X-bits tolerance capacity can be enhanced by choosing a proper memory size and weight of check matrix, which can also be obtained by an optimized input assignment algorithm. The theoretic analysis and experimental results on aliasing shows the efficiency of the proposed encoder.
  • Keywords
    convolutional codes; digital circuits; integrated circuit testing; logic testing; X-bits tolerance capacity; bit cancellations; check matrix; compaction ratio; convolutional code; memory size; single-output encoder; test response compaction; x-tolerance enhancement; Block codes; Buffer storage; Circuit testing; Compaction; Computers; Convolutional codes; Costs; Error correction codes; Pins; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
  • Print_ISBN
    0-7803-8736-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2005.1466129
  • Filename
    1466129