DocumentCode :
438451
Title :
Hierarchical analysis of process variation for mixed-signal systems
Author :
Liu, Fang ; Ozev, Sule
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Volume :
1
fYear :
2005
fDate :
18-21 Jan. 2005
Firstpage :
465
Abstract :
Increasing process variability necessitates reliable analysis of its effects on circuit performance not only at the top level but also at intermediate levels. Mixed-signal circuits with multiple hierarchical layers, multiple parameters, and complex functional relations are especially susceptible to such variations. In this paper, we present a hierarchical method for process variation analysis. The ability to compute the variance of parameters at each hierarchical layer makes the method particularly suited for helping designers through design iterations. Experimental results indicate that the proposed method achieves high computational efficiency with up to 2% compromise in accuracy even for highly nonlinear functional relations.
Keywords :
integrated circuit design; mixed analogue-digital integrated circuits; network analysis; process design; design iterations; hierarchical analysis; hierarchical layer; mixed-signal circuits; mixed-signal systems; nonlinear functional relations; process variability; process variation analysis; Circuit optimization; Circuit simulation; Circuit testing; Computational modeling; Control systems; Manufacturing; Monte Carlo methods; Performance analysis; Process control; Tolerance analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN :
0-7803-8736-8
Type :
conf
DOI :
10.1109/ASPDAC.2005.1466208
Filename :
1466208
Link To Document :
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