Title :
A 1-V 20-ns 512-Kbit MT-CMOS SRAM with auto-power-cut scheme using dummy memory cells
Author :
Morishima, C. ; Nii, K. ; Tsujihashi, Y. ; Hayakawa, Y. ; Makino, H.
Author_Institution :
Mitsubishi Electric Corporation, Hyogo, Japan
Abstract :
A 512-Kbit SRAM using dual threshold voltage transistors has been fabricated. The memory cells are composed of high-threshold voltage transistors and cutting off the power supply to the peripheral circuit reduces the power consumption without data destruction during sleep mode. The SRAM adopts a current-mirror type sense-amplifier circuit for fast access. An autopower-cut circuit automatically cuts off the current to the sense-amplifier circuit after the read operation is finished. The SRAM has a 20 ns access time, a 23.5 mW active power consumption at 10 MHz and a less than 10 µW sleep power consumption with a 1 V power supply.
Keywords :
Circuit testing; Driver circuits; Energy consumption; Fabrication; Large scale integration; Leakage current; Low voltage; Power supplies; Random access memory; Threshold voltage;
Conference_Titel :
Solid-State Circuits Conference, 1998. ESSCIRC '98. Proceedings of the 24th European
Conference_Location :
The Hague, The Netherlands
DOI :
10.1109/ESSCIR.1998.186306