DocumentCode :
439720
Title :
Reliable handling of fempto-ampere currents in standard CMOS
Author :
Linares-Barranco, Bernabé ; Serrano-Gotarredona, Teresa
Author_Institution :
Instituto de Microelectrónica de Sevilla, Sevilla, Spain
fYear :
2002
fDate :
24-26 Sept. 2002
Firstpage :
109
Lastpage :
112
Abstract :
In this paper we show and validate a reliable circuit design technique for current mode signal processing down to fempto-amperes. The technique involves specific-current extractors and logarithmic current splitters for obtaining on-chip sub-pA currents. It is based on "source voltage shifting". A special current mirror based on this technique is also introduced for reliably replicating such low currents. To monitor and measure currents down to a few fempto-amps a special on-chip saw-tooth oscillator is used. This way, sub-pA currents are characterized without driving them off-chip, nor requiring expensive instrumentation with complicated low leakage setups. Experimental results of the described blocks are provided, as well as a technique for characterizing the noise of transistors driving such small currents. As an application example, a simple log-domain first-order low-pass filter is implemented that uses a 100fF capacitor to achieve a 3dB frequency of 0.5Hz, using an area of 12µm × 24.35µm in a 0.35µm CMOS process.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
Conference_Location :
Florence, Italy
Type :
conf
Filename :
1471478
Link To Document :
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