DocumentCode
439787
Title
Precision and robust CMOS voltage reference based on the work function difference of poly Si gate
Author
Watanabe, H. ; Ando, S. ; Aota, H. ; Dainin, M. ; Chun, Y.J. ; Taniguchi, K.
Author_Institution
Ricoh Co. Ltd., Osaka, Japan
fYear
2002
fDate
24-26 Sept. 2002
Firstpage
387
Lastpage
390
Abstract
This paper presents a new precision and robust CMOS voltage reference consisting of two sets of pair transistors: One of the sets has negative temperature coefficient of their threshold voltage difference, while the other positive temperature coefficient. A main feature of the Voltage Reference is the use of pair transistors which ensures the accuracy of the reference circuit under process fluctuations. The measured results revealed without adjusting trimming that the voltage reference has (1)excellent reproducibility of the output voltage within ± 2%, (2)low temperature coefficient of less than 80ppm/°C and (3)low current consumption of 0.6µA.
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
Conference_Location
Florence, Italy
Type
conf
Filename
1471546
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