• DocumentCode
    439787
  • Title

    Precision and robust CMOS voltage reference based on the work function difference of poly Si gate

  • Author

    Watanabe, H. ; Ando, S. ; Aota, H. ; Dainin, M. ; Chun, Y.J. ; Taniguchi, K.

  • Author_Institution
    Ricoh Co. Ltd., Osaka, Japan
  • fYear
    2002
  • fDate
    24-26 Sept. 2002
  • Firstpage
    387
  • Lastpage
    390
  • Abstract
    This paper presents a new precision and robust CMOS voltage reference consisting of two sets of pair transistors: One of the sets has negative temperature coefficient of their threshold voltage difference, while the other positive temperature coefficient. A main feature of the Voltage Reference is the use of pair transistors which ensures the accuracy of the reference circuit under process fluctuations. The measured results revealed without adjusting trimming that the voltage reference has (1)excellent reproducibility of the output voltage within ± 2%, (2)low temperature coefficient of less than 80ppm/°C and (3)low current consumption of 0.6µA.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
  • Conference_Location
    Florence, Italy
  • Type

    conf

  • Filename
    1471546