DocumentCode
439917
Title
Temperature dependence of apparent threshold voltage of silicon MOS transistors at cryogenic temperatures
Author
Nathanson, H.C. ; Jund, C. ; Grosvalet, J.
Volume
13
fYear
1967
fDate
1967
Firstpage
3
Lastpage
4
Keywords
Cryogenics; MOSFETs; Microwave measurements; Microwave theory and techniques; Noise generators; Noise measurement; Probability density function; Silicon; Temperature dependence; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1967 International
Conference_Location
IEEE
Type
conf
Filename
1475016
Link To Document