• DocumentCode
    440235
  • Title

    Excess Noise in Sub-micron Silicon FET: Characterization, Prediction and Control

  • Author

    Franca-Neto, Luiz M. ; Harris, James S.

  • Author_Institution
    Stanford University, Stanford, CA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    252
  • Lastpage
    255
  • Keywords
    Conducting materials; Electric resistance; FETs; Noise generators; Noise level; Noise measurement; Resistance heating; Resistors; Semiconductor device noise; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505487
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=440235