Title :
Hybrid Integration of Spin-Valves and MESFETS: Technology Test for Future MRAM
Author :
Das, J. ; Boeve, H. ; De Boeck, J. ; Borghs, G.
Author_Institution :
IMEC, Leuven, Belgium
Keywords :
Giant magnetoresistance; III-V semiconductor materials; MESFETs; Magnetic fields; Magnetic multilayers; Random access memory; Semiconductor diodes; Testing; Transistors; Valves;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
