• DocumentCode
    440249
  • Title

    Low frequency noise characterisation of submicron vertical heterojuncton pMOSFETs

  • Author

    Collaert, N. ; Verheyen, P. ; De Meyer, K.

  • Author_Institution
    IMEC, Leuven, Belgium
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    308
  • Lastpage
    311
  • Keywords
    Electrical resistance measurement; Fluctuations; Frequency; Germanium silicon alloys; Heterojunctions; Low-frequency noise; MOSFETs; Noise generators; Noise measurement; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505501
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=440249