440278

An Extended BSIM3v3 Model Card for a Vertical 130 nm p-MOSFET

Korbel, A. ; Mecking, S. ; Langmann, U. ; Schulz, T. ; Aeugle, T. ; Rösner, W. ; Risch, L.

Ruhr-Universit¨at Bochum, Germany

1

1999

13-15 Sept. 1999

460

463

Capacitance; Character generation; Circuit simulation; Contacts; Geometry; Integrated circuit reliability; MOSFET circuits; Parameter extraction; Read only memory; SPICE;

English

ieee

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Leuven, Belgium

2-86332-245-1

conf

1505539