DocumentCode
440280
Title
Efficient Methodologies for Statistical Characterisation of Analogue Designs for Submicron CMOS Technologies
Author
Vanderbauwhede, Wim ; Rombouts, E. ; Ning, Zepeng ; Tack, M. ; Healy, S. ; McCarthy, K. ; Mathewson, A.
Author_Institution
Alcatel Microelectronics, Oudenaarde, Belgium
Volume
1
fYear
1999
fDate
13-15 Sept. 1999
Firstpage
468
Lastpage
471
Abstract
This paper presents an efficient methodology for the statistical characterisation of analogue. Principal Component Analysis is used to generate a set of equations with uncorrelated variables, from which the SPICE mode! parameters can be calculated The design is simulated for different values of the variables, which can be generated by Monte-Carlo, DOE or via a sensitivity analysis. These three methods are compared using an operational amplifier design as a testbench.
Keywords
Bipolar transistors; CMOS process; CMOS technology; Equivalent circuits; Laboratories; Photonic band gap; Power supplies; Semiconductor device modeling; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location
Leuven, Belgium
Print_ISBN
2-86332-245-1
Type
conf
Filename
1505541
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