Title :
Efficient Methodologies for Statistical Characterisation of Analogue Designs for Submicron CMOS Technologies
Author :
Vanderbauwhede, Wim ; Rombouts, E. ; Ning, Zepeng ; Tack, M. ; Healy, S. ; McCarthy, K. ; Mathewson, A.
Author_Institution :
Alcatel Microelectronics, Oudenaarde, Belgium
Abstract :
This paper presents an efficient methodology for the statistical characterisation of analogue. Principal Component Analysis is used to generate a set of equations with uncorrelated variables, from which the SPICE mode! parameters can be calculated The design is simulated for different values of the variables, which can be generated by Monte-Carlo, DOE or via a sensitivity analysis. These three methods are compared using an operational amplifier design as a testbench.
Keywords :
Bipolar transistors; CMOS process; CMOS technology; Equivalent circuits; Laboratories; Photonic band gap; Power supplies; Semiconductor device modeling; Temperature dependence; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
