DocumentCode
440281
Title
1/f Noise Simulation in a-Si TFTs over Linear, Saturation and Subthreshold Regions. Comparison to BSIM Model
Author
Rhayem, J. ; Rigaud, D. ; Valenza, M. ; Szydlo, N. ; Lebrun, H.
Author_Institution
Universite Montpellier II, France
Volume
1
fYear
1999
fDate
13-15 Sept. 1999
Firstpage
472
Lastpage
475
Keywords
Active noise reduction; Amorphous silicon; Conductive films; Crystallization; Data mining; Equations; Fluctuations; MOSFET circuits; Marine vehicles; Thin film transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location
Leuven, Belgium
Print_ISBN
2-86332-245-1
Type
conf
Filename
1505542
Link To Document