Title :
Compact modeling of high-frequency distortion in bipolar transistors
Author :
Schroter, M. ; Pehlke, D.R. ; Lee, T.Y.
Author_Institution :
Conexant Systems, Inc., Newport Beach, CA, USA
Keywords :
Bipolar transistors; Circuit simulation; Distortion measurement; Frequency; Harmonic distortion; Mathematical model; Nonlinear equations; Power amplifiers; Predictive models; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
