Title :
A simple model for analogue applications of dynamic threshold MOSTs
Author :
Smedes, T. ; Knol, J. ; Annema, A.J.
Author_Institution :
Philips Semiconductors, Nijmegen, The Netherlands
Abstract :
We describe a practical model for the dynamic threshold MOST, used in analogue applications. Comparison with device simulations and measurements for several technology generations support the quality of the model.
Keywords :
Bipolar transistors; Circuit synthesis; Electric breakdown; Electrons; Force control; Impact ionization; Integrated circuit modeling; Interpolation; Jacobian matrices; Resistors;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
