• DocumentCode
    440287
  • Title

    Simulation of 0.15 Micron CMOS Device Performance

  • Author

    Jones, S.K. ; Badenes, G.

  • Author_Institution
    Marconi Materials Technology, Northants, United Kingdom
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    496
  • Lastpage
    499
  • Keywords
    Acceleration; Capacitance; Doping; MOS devices; MOSFET circuits; Materials science and technology; Performance analysis; Predictive models; Process design; Protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505548