Title :
Off-State Breakdown in GaAs Power HFETs
Author :
Cova, Paolo ; Menozzi, Roberto ; Dieci, Domenico ; Canali, Claudio ; Pavesi, Maura ; Meneghesso, Gaudenzio
Author_Institution :
University of Parma, Italy
Keywords :
Breakdown voltage; Current measurement; Electric breakdown; FETs; Frequency; Gallium arsenide; HEMTs; Irrigation; MODFETs; Power measurement;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1