DocumentCode :
440295
Title :
Off-State Breakdown in GaAs Power HFETs
Author :
Cova, Paolo ; Menozzi, Roberto ; Dieci, Domenico ; Canali, Claudio ; Pavesi, Maura ; Meneghesso, Gaudenzio
Author_Institution :
University of Parma, Italy
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
544
Lastpage :
547
Keywords :
Breakdown voltage; Current measurement; Electric breakdown; FETs; Frequency; Gallium arsenide; HEMTs; Irrigation; MODFETs; Power measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505560
Link To Document :
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