Title :
Breakdown triggering in PM-HEMTs studied by means of Monte Carlo simulator
Author :
Di Carlo, A. ; Rossi, L. ; Lugli, P. ; Meneghesso, G. ; Zanoni, E.
Author_Institution :
Universita "Tor Vergata", Rome, Italy
Keywords :
Breakdown voltage; Charge carrier processes; DH-HEMTs; Electric breakdown; Gallium arsenide; HEMTs; Impact ionization; MESFETs; MODFETs; Monte Carlo methods;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
