DocumentCode :
440310
Title :
RF modelling for 0.1um gate length MOSFETs
Author :
Morifuji, E. ; Ohguro, T. ; Kimijima, H. ; Yoshitomi, T. ; Momose, H.S. ; Katsumata, Y. ; Ishimaru, K. ; Matsuoka, F. ; Kinugawa, M. ; Iwai, H.
Author_Institution :
Toshiba Corporation, Yokohama, Japan
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
656
Lastpage :
659
Keywords :
Capacitance; Circuit simulation; Equations; Equivalent circuits; MOSFETs; Noise figure; Radio frequency; Roentgenium; Scattering parameters; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505588
Link To Document :
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