DocumentCode

440311

Title

Reliable extraction of RF figures-of-merit for MOSFETs

Author

Vandamme, E.P. ; Schreurs, D. ; Nauwelaers, B. ; van Dinther, C. ; Badenes, G. ; Deferm, L.

Author_Institution

IMEC, Leuven, Belgium

Volume

1

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

660

Lastpage

663

Keywords

CMOS technology; Extrapolation; Fingers; Frequency measurement; MOSFETs; Radio frequency; SPICE; Semiconductor device modeling; TV; Transducers;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

conf

Filename

1505589