DocumentCode :
441321
Title :
A methodology to study bright band structure on a global scale from TRMM precipitation radar
Author :
Zafar, Basim ; Chandrasekar, V.
Volume :
5
fYear :
2005
fDate :
25-29 July 2005
Firstpage :
3400
Lastpage :
3403
Keywords :
Backscatter; Dielectric constant; Dielectric measurements; Neural networks; Neurons; Pollution measurement; Radar measurements; Reflectivity; Self organizing feature maps; Surface contamination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2005. IGARSS '05. Proceedings. 2005 IEEE International
Print_ISBN :
0-7803-9050-4
Type :
conf
DOI :
10.1109/IGARSS.2005.1526572
Filename :
1526572
Link To Document :
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