Title :
Facial expression analysis by generalized eigen-space method based on class-features (GEMC)
Author :
Eguchi, I. ; Kotani, K.
Author_Institution :
Sch. of Inf. Sci., Japan Adv. Inst. of Sci. & Technol., Ishikawa, Japan
Abstract :
This paper describes a new method of facial expression recognition based on independent component analysis (ICA) and eigen-space method. We had proposed eigen-space method based on class-features (EMC), and EMC was the outstanding method with classification accuracy superior to multiple discriminant analysis (MDA). Our new method, GEMC, is a generalization of EMC by using ICA technique. GEMC has discriminated the facial expression class in a precision 10 or more points higher than conventional methods (EMC, MDA and ICA) because of classification experiments.
Keywords :
eigenvalues and eigenfunctions; image recognition; independent component analysis; GEMC; class-features; facial expression analysis; facial expression recognition; generalized eigen-space method; independent component analysis; multiple discriminant analysis; Electromagnetic compatibility; Equations; Face recognition; Independent component analysis; Information science; Kernel; Multidimensional systems; Principal component analysis; Scattering; Transforms;
Conference_Titel :
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN :
0-7803-9134-9
DOI :
10.1109/ICIP.2005.1529745