• DocumentCode
    443312
  • Title

    A comparison of wavelet and wavelet-Bayesian approaches for the classification of auditory brainstem response

  • Author

    Zhang, R. ; McAllister, G. ; Scotney, B. ; McClean, S. ; Houston, G.

  • Author_Institution
    Fac. of Eng., Ulster Univ., Northern Ireland, UK
  • fYear
    2005
  • fDate
    3-4 Nov. 2005
  • Firstpage
    65
  • Lastpage
    70
  • Abstract
    The auditory brainstem response (ABR) is the early portion of the electrical activity of the brain in response to the auditory stimulus and is recorded from electrodes attached to the scalp. It has become a very useful and routine clinical tool for hearing assessment. Since the ABR is easily obscured by the background EEG activities, averaging of many repeated trials is necessary and it typically requires up to 2000 repetitions. This number of repetitions can be very difficult, time consuming and uncomfortable for some subjects. Therefore, reducing the required number of repetitions offers a great advantage in the clinical situation. In this study the ABR data (574 ABRs with 128 repetitions and 1160 ABRs with 64 repetitions) recorded from 20 subjects are used. Two classification approaches, wavelet approach and wavelet-Bayesian approach for response detection are developed and a comparison of these two methods is considered. A 10-fold cross-validation method and t-test are also applied in this paper for performance comparison purposes.
  • Keywords
    auditory evoked potentials; belief networks; biomedical electrodes; electroencephalography; medical signal processing; pattern classification; wavelet transforms; Bayesian network; auditory brainstem response classification; auditory stimulus; background EEG activity; brain electrical activity; classification approach; cross-validation method; hearing assessment; scalp electrode; t-test; wavelet transform; wavelet-Bayesian approach;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Medical Applications of Signal Processing, 2005. The 3rd IEE International Seminar on (Ref. No. 2005-1119)
  • Conference_Location
    IET
  • Print_ISBN
    0-86341-570-9
  • Type

    conf

  • Filename
    1543118