• DocumentCode
    44381
  • Title

    Three-Dimensional Full-Wave Electromagnetics and Nonlinear Hot Electron Transport With Electronic Band Structure for High-Speed Semiconductor Device Simulation

  • Author

    Grupen, Matt

  • Author_Institution
    Air Force Res. Lab., Wright-Patterson AFB, OH, USA
  • Volume
    62
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    2868
  • Lastpage
    2877
  • Abstract
    For predictive simulation of high-speed electronic components, an accurate and numerically efficient hot electron transport model is solved simultaneously with Maxwell´s full-wave vector field equations. The transport model is based on ideal Fermi gas kinetics and incorporates electronic band structure as well as the essential electron scattering mechanisms. It couples self-consistently to full-wave electromagnetics through a field discretization scheme based on the relationship between Delaunay and Voronoi meshes. Three-dimensional simulations of different GaAs transistor designs produce dc and high-frequency results that compare well with measured data.
  • Keywords
    III-V semiconductors; gallium arsenide; hot carriers; semiconductor device models; Delaunay mesh; Maxwell full-wave vector field equation; Voronoi mesh; electronic band structure; essential electron scattering mechanisms; field discretization scheme; gallium arsenide transistor design; high-speed electronic components; high-speed semiconductor device simulation; ideal Fermi gas kinetics; nonlinear hot electron transport; numerically-efficient hot electron transport model; predictive simulation; three-dimensional full-wave electromagnetics; three-dimensional simulation; Gallium arsenide; Isosurfaces; Mathematical model; Mobile communication; Numerical models; Scattering; Transistors; Boltzmann equation; Delaunay; Fermi kinetics; Voronoi; energy transport; full-wave electromagnetics; semiconductor device simulation;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2014.2365781
  • Filename
    6957604