Title :
Terahertz near-field microscopy
Author :
Planken, P. C M ; van Rijmenam, C.W.E.M. ; van der Valk, N.C.J.
Author_Institution :
Fac. of Appl. Sci., Delft Univ. of Technol., Netherlands
Abstract :
We present results on the spatial extent and origin of the near-field of a metal tip and the first measurement on a crystal of CsI using THz apertureless scanning near-field optical microscopy.
Keywords :
caesium compounds; near-field scanning optical microscopy; optical materials; submillimetre wave imaging; CsI; CsI crystal; THz apertureless scanning near-field optical microscopy; metal tip; spatial extent; Biomedical optical imaging; Crystals; Face detection; Frequency; Optical imaging; Optical microscopy; Probes; Shafts; Spectroscopy; Ultrafast optics;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN :
1-55752-796-2
DOI :
10.1109/QELS.2005.1548809
