DocumentCode
444292
Title
Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation
Author
Ramsay, Euan ; Xiao, Dong ; Reid, Derryck T. ; Offenbeck, Bernd ; Sundermeyer, Jan ; Seemann, Kay ; Weber, Norbert
Author_Institution
Ultrafast Opt. Group, Heriot-Watt Univ., Edinburgh, UK
Volume
2
fYear
2005
fDate
22-27 May 2005
Firstpage
818
Abstract
We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3 μm femtosecond pulses. A linear relationship between the signal and electric field is found.
Keywords
CMOS integrated circuits; high-speed optical techniques; optical harmonic generation; semiconductor devices; silicon; 2.3 micron; Si; femtosecond pulses; probing electrical signals; second harmonic generation; silicon CMOS devices; Frequency conversion; Laser excitation; Nonlinear optics; Optical harmonic generation; Optical pumping; Photodiodes; Photonic band gap; Probes; Silicon; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN
1-55752-796-2
Type
conf
DOI
10.1109/QELS.2005.1548948
Filename
1548948
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