• DocumentCode
    44430
  • Title

    A Reconfigurable Mostly-Digital Delta-Sigma ADC With a Worst-Case FOM of 160 dB

  • Author

    Taylor, Gareth ; Galton, Ian

  • Author_Institution
    Analog Devices, San Diego,
  • Volume
    48
  • Issue
    4
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    983
  • Lastpage
    995
  • Abstract
    This paper presents a second-generation mostly-digital background-calibrated oversampling ADC based on voltage- controlled ring oscillators (VCROs). Its performance is in line with the best \\Delta \\Sigma modulator ADCs published to date, but it occupies much less circuit area, is reconfigurable, and consists mainly of digital circuitry. Enhancements relative to the first-generation version include digitally background-calibrated open-loop V / I conversion in the VCRO to increase ADC bandwidth and enable operation from a single low-voltage power supply, quadrature coupled ring oscillators to reduce quantization noise, digital over-range correction to improve dynamic range and enable graceful overload behavior, and various circuit-level improvements. The ADC occupies 0.075 mm ^{2} in a 65 nm CMOS process and operates from a single 0.9–1.2 V supply. Its sample-rate is tunable from 1.3 to 2.4 GHz over which the SNDR spans 70–75 dB, the bandwidth spans 5–37.5 MHz, and the minimum SNDR+ 10log(bandwidth/power dissipation) figure of merit (FOM) is 160 dB.
  • Keywords
    Bandwidth; Calibration; Integrated circuits; Modulation; Noise; Quantization; Voltage-controlled oscillators; ADC; VCO ADC; continuous-time delta-sigma modulator; delta-sigma modulator;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2239113
  • Filename
    6450122