Title :
Analysis of implantation induced gratings for CWDM
Author :
Sonkar, Ramesh K. ; Das, Utpal
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., Kanpur, India
Abstract :
The Bragg reflection coefficients suitable for a CWDM system have been calculated by using coupled mode theory based on perturbation obtained by impurity induced intermixing of quantum wells and analyzed for different order gratings.
Keywords :
Bragg gratings; coupled mode analysis; ion implantation; optical communication; optical fabrication; optical waveguides; perturbation techniques; quantum wells; ultraviolet lithography; wavelength division multiplexing; Bragg reflection coefficient; CWDM system; coupled mode theory; implantation induced grating; impurity induced intermixing; lithography; perturbation; quantum well; waveguide; Bragg gratings; Costs; Coupled mode analysis; Distributed feedback devices; Impurities; Lithography; Optical filters; Optical reflection; Optical waveguides; Wavelength division multiplexing;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN :
1-55752-796-2
DOI :
10.1109/QELS.2005.1548977
