DocumentCode
444318
Title
Analysis of implantation induced gratings for CWDM
Author
Sonkar, Ramesh K. ; Das, Utpal
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol., Kanpur, India
Volume
2
fYear
2005
fDate
22-27 May 2005
Firstpage
904
Abstract
The Bragg reflection coefficients suitable for a CWDM system have been calculated by using coupled mode theory based on perturbation obtained by impurity induced intermixing of quantum wells and analyzed for different order gratings.
Keywords
Bragg gratings; coupled mode analysis; ion implantation; optical communication; optical fabrication; optical waveguides; perturbation techniques; quantum wells; ultraviolet lithography; wavelength division multiplexing; Bragg reflection coefficient; CWDM system; coupled mode theory; implantation induced grating; impurity induced intermixing; lithography; perturbation; quantum well; waveguide; Bragg gratings; Costs; Coupled mode analysis; Distributed feedback devices; Impurities; Lithography; Optical filters; Optical reflection; Optical waveguides; Wavelength division multiplexing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN
1-55752-796-2
Type
conf
DOI
10.1109/QELS.2005.1548977
Filename
1548977
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