• DocumentCode
    444346
  • Title

    Using thermal profiling to quantify optical feedback into semiconductor lasers

  • Author

    Kapusta, Evelyn ; Luerssen, D. ; Hudgings, Janice

  • Author_Institution
    Dept. of Phys., Mount Holyoke Coll., South Hadley, MA, USA
  • Volume
    2
  • fYear
    2005
  • fDate
    22-27 May 2005
  • Firstpage
    1011
  • Abstract
    Thermal profiling is an ideal technique for monitoring optical feedback into semiconductor lasers in photonic integrated circuits. Quantitative measurements of optical output power, optical feedback magnitude, and threshold current shift are obtained without optical measurements.
  • Keywords
    integrated optoelectronics; laser beams; laser feedback; semiconductor lasers; thermo-optical effects; optical feedback magnitude measurement; optical feedback monitoring; optical output power measurement; photonic integrated circuit; quantitative measurement; semiconductor lasers; thermal profiling; threshold current shift measurement; Current measurement; Integrated circuit measurements; Laser feedback; Monitoring; Optical feedback; Photonic integrated circuits; Power generation; Power measurement; Semiconductor lasers; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2005. QELS '05
  • Print_ISBN
    1-55752-796-2
  • Type

    conf

  • DOI
    10.1109/QELS.2005.1549013
  • Filename
    1549013
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=444346