Title :
Design, fabrication, and characterization of engineered materials in the microwave and millimeter wave regime
Author :
Lu, Zhaolin ; Shi, Shouyuan ; Schuetz, Christopher A. ; Prather, Dennis W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Delaware Univ., Newark, DE, USA
Abstract :
We present the study of a two-dimensional square-lattice photonic crystal with all-angle negative refraction in its first band. Using this photonic crystal, we designed and fabricated a flat lens functioning as a cylindrical lens, by increasing the vertical dimension of the photonic crystal. Two-dimensional finite-difference time-domain simulation validated negative imaging and sub-wavelength resolution. To perform the experiment, a microwave imaging system was built based on a vector network analyzer. Field distributions were acquired by scanning the imaging plane and object plane. The experiment demonstrated negative refraction imaging in both amplitude and phase, and verified sub-wavelength resolution.
Keywords :
electromagnetic wave refraction; finite difference time-domain analysis; lenses; microwave devices; microwave imaging; microwave materials; millimetre wave devices; photonic crystals; all-angle negative refraction; cylindrical lens; engineered microwave materials; engineered millimeter wave materials; field distributions; flat lens; microwave imaging system; negative imaging; subwavelength resolution; two-dimensional finite-difference time-domain simulation; two-dimensional square-lattice photonic crystal; vector network analyzer; Crystalline materials; Design engineering; Fabrication; Image resolution; Lenses; Microwave imaging; Optical design; Optical materials; Optical refraction; Photonic crystals;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1551972
