DocumentCode
445332
Title
Long term transients in MOSFEG 1/f noise under switched bias conditions
Author
Louie, M.Y. ; Miller, D.A. ; Jacob, M.E. ; Forbes, L.
Volume
1
fYear
2005
fDate
June 20-22, 2005
Firstpage
79
Lastpage
80
Keywords
Circuit noise; Circuit testing; Frequency dependence; Frequency measurement; Low-frequency noise; MOSFET circuits; Noise measurement; Noise reduction; Threshold voltage; Zero voltage switching;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 2005. DRC '05. 63rd
Print_ISBN
0-7803-9040-7
Type
conf
DOI
10.1109/DRC.2005.1553064
Filename
1553064
Link To Document