DocumentCode
445354
Title
Time and temperature dependence of the drain current of PF-based OFETs
Author
Hamilton, Michael C. ; Kanicki, Jerzy
Volume
1
fYear
2005
fDate
June 20-22, 2005
Firstpage
139
Lastpage
140
Keywords
Frequency; Indium tin oxide; Insulation; Lighting; Molecular electronics; OFETs; Stress measurement; Temperature dependence; Thermal stresses; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 2005. DRC '05. 63rd
Print_ISBN
0-7803-9040-7
Type
conf
DOI
10.1109/DRC.2005.1553093
Filename
1553093
Link To Document