• DocumentCode
    445381
  • Title

    Impact of the nanotube diameter on the performance of CNFETs

  • Author

    Chen, Zhihong ; Appenzeller, Joerg ; Knoch, Joachim ; Lin, Yu-Ming ; Avouris, Phaedon

  • Author_Institution
    IBMT. J. Watson Res. Center, Yorktown Heights, NY
  • Volume
    1
  • fYear
    2005
  • fDate
    22-22 June 2005
  • Firstpage
    237
  • Lastpage
    238
  • Abstract
    This study investigates 38 CNFETs and shows that nearly 3 orders of magnitude current variation can be explained in a comprehensive way by the diameter variation among nanotubes alone. This is the first systematic analysis that correlates the device performance with the nanotube properties quantitatively. It also shows that one can neglect the impact of the preparation on the contact quality to a large extend
  • Keywords
    carbon nanotubes; field effect devices; nanotube devices; CNFET; contact quality; diameter variation; magnitude current variation; nanotube diameter; CNTFETs; Geometrical optics; Geometry; MOSFETs; Nanoscale devices; Nanotube devices; Performance analysis; Photonic band gap; Thin film devices; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 2005. DRC '05. 63rd
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    0-7803-9040-7
  • Type

    conf

  • DOI
    10.1109/DRC.2005.1553137
  • Filename
    1553137