Title :
Electromagnetic emission within the beat field of the silicon samples with differently polished surfaces
Author :
Arefyev, K. ; Salnikov, Vladimir ; Lukyanova, Evguenya
Author_Institution :
Tomsk Polytech. Inst., Russia
fDate :
26 June-3 July 2004
Abstract :
Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.
Keywords :
elemental semiconductors; polishing; silicon; surface electromagnetic waves; Si; beat field; impulse electromagnetic emission; polished surface; surface treatment; Electromagnetic fields; Electromagnetic heating; Electromagnetic measurements; Grain size; Paramagnetic materials; Powders; Silicon; Solids; Surface treatment; Temperature distribution;
Conference_Titel :
Science and Technology, 2004. KORUS 2004. Proceedings. The 8th Russian-Korean International Symposium on
Print_ISBN :
0-7803-8383-4
DOI :
10.1109/KORUS.2004.1555587
