DocumentCode
446667
Title
Robust test set for flash AD converter
Author
Salama, Aly E. ; Amer, Hassanein
Author_Institution
Dept. of Electron. Eng., American Univ. in Cairo, Egypt
Volume
1
fYear
2003
fDate
27-30 Dec. 2003
Firstpage
13
Abstract
This paper presents a new test scheme for the flash AD converter. This converter is a mixed-signal circuit that produces the same digital output for a range of analog inputs. It is shown that the test coverage is 100 irrespective of component tolerances.
Keywords
analogue-digital conversion; integrated circuit testing; mixed analogue-digital integrated circuits; flash AD converter; integrated circuit testing; mixed-signal circuit; Analog circuits; Analog-digital conversion; Circuit faults; Circuit testing; Degradation; Digital circuits; Robustness; System testing; System-on-a-chip; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
ISSN
1548-3746
Print_ISBN
0-7803-8294-3
Type
conf
DOI
10.1109/MWSCAS.2003.1562207
Filename
1562207
Link To Document