• DocumentCode
    447494
  • Title

    Fault-tolerance of basis function networks using tensor product stabilizers

  • Author

    Eickhoff, Ralf ; Rückert, Ulrich

  • Author_Institution
    Syst. & Circuit Technol., Paderborn Univ., Germany
  • Volume
    3
  • fYear
    2005
  • fDate
    10-12 Oct. 2005
  • Firstpage
    2144
  • Abstract
    Neural networks are intended to be used in future nanoelectronics since these architectures seem to be fault-tolerant to malfunctioning elements and robust to noise. In this paper, the robustness to noise of basis function networks using tensor product stabilizers is analyzed and upper bounds of the mean square error under noise contaminated weights or inputs are determined. Furthermore, consequences of permanently malfunctioning neurons are investigated and their impact on the mean squared error is analyzed. To achieve a reliable operation of the neural network necessary restrictions are introduced. Finally, the impact of technical realizations is investigated and its complexity is compared to radial basis functions.
  • Keywords
    fault tolerance; logic testing; mean square error methods; radial basis function networks; tensors; basis function networks fault-tolerance; mean square error; nanoelectronics; noise contaminated weights; tensor product stabilizers; Circuit noise; Fault tolerance; Fault tolerant systems; Nanoelectronics; Neural networks; Neurons; Noise robustness; Tensile stress; Upper bound; Working environment noise; Basis Function networks; Neural networks; approximation; fault-tolerance; tensor product stabilizer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2005 IEEE International Conference on
  • Print_ISBN
    0-7803-9298-1
  • Type

    conf

  • DOI
    10.1109/ICSMC.2005.1571466
  • Filename
    1571466