DocumentCode
447494
Title
Fault-tolerance of basis function networks using tensor product stabilizers
Author
Eickhoff, Ralf ; Rückert, Ulrich
Author_Institution
Syst. & Circuit Technol., Paderborn Univ., Germany
Volume
3
fYear
2005
fDate
10-12 Oct. 2005
Firstpage
2144
Abstract
Neural networks are intended to be used in future nanoelectronics since these architectures seem to be fault-tolerant to malfunctioning elements and robust to noise. In this paper, the robustness to noise of basis function networks using tensor product stabilizers is analyzed and upper bounds of the mean square error under noise contaminated weights or inputs are determined. Furthermore, consequences of permanently malfunctioning neurons are investigated and their impact on the mean squared error is analyzed. To achieve a reliable operation of the neural network necessary restrictions are introduced. Finally, the impact of technical realizations is investigated and its complexity is compared to radial basis functions.
Keywords
fault tolerance; logic testing; mean square error methods; radial basis function networks; tensors; basis function networks fault-tolerance; mean square error; nanoelectronics; noise contaminated weights; tensor product stabilizers; Circuit noise; Fault tolerance; Fault tolerant systems; Nanoelectronics; Neural networks; Neurons; Noise robustness; Tensile stress; Upper bound; Working environment noise; Basis Function networks; Neural networks; approximation; fault-tolerance; tensor product stabilizer;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man and Cybernetics, 2005 IEEE International Conference on
Print_ISBN
0-7803-9298-1
Type
conf
DOI
10.1109/ICSMC.2005.1571466
Filename
1571466
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