• DocumentCode
    447782
  • Title

    Measurements of the complex refractive index properties of the liquid crystal materials by using the W-band waveguide test cell

  • Author

    Nose, T. ; Saito, S. ; Honma, M.

  • Author_Institution
    Dept. of Electron. & Inf. Syst., Akita Prefectural Univ., Yurihonjyo, Japan
  • Volume
    1
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Firstpage
    186
  • Abstract
    Refractive index and loss properties are measured by using W-band rectangular waveguide test cell. Measurement of material properties in the ultrahigh frequency region becomes extremely difficult. We have proposed a novel measurements method utilizing the reflection type test cell fabricated with rectangular waveguide. Fundamental transmission mode in the waveguide is very simple and anisotropy of the LC materials can easily be determined by changing the direction of the magnetic field applied for the LC molecular orientation, in this work, we use a Teflon window for sealing the liquid like LC materials to reduce the reflection of the MMW signal. Complex refractive indices of the LC materials can successfully be determined up to 110GHz without any complex data analysis.
  • Keywords
    dielectric loss measurement; liquid crystals; magnetic fields; rectangular waveguides; refractive index measurement; LC materials; LC molecular orientation; MMW signal; Teflon window; W-band rectangular waveguide test cell; liquid crystal materials; loss properties measurement; magnetic field direction; material properties; reflection type test cell; refractive index measurement; transmission mode; ultrahigh frequency region; Crystalline materials; Liquid crystals; Liquid waveguides; Magnetic field measurement; Magnetic materials; Materials testing; Rectangular waveguides; Reflection; Refractive index; UHF measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
  • Print_ISBN
    0-7803-9348-1
  • Type

    conf

  • DOI
    10.1109/ICIMW.2005.1572470
  • Filename
    1572470