Title :
3D Analysis of scattering losses due to sidewall roughness in microphotonic waveguides: high index-contrast
Author_Institution :
Res. Lab. of Electron., Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
We present a 3D analysis of scattering losses due to sidewall roughness in rectangular dielectric waveguides valid for any refractive-index-contrast and field polarization. We show that the typical 2D analyses can substantially over-estimate scattering losses.
Keywords :
micro-optics; optical losses; optical waveguides; rectangular waveguides; surface roughness; field polarization; microphotonic waveguides; rectangular dielectric waveguides; refractive-index-contrast; scattering losses; sidewall roughness; Dielectric losses; Green´s function methods; Integrated optics; Optical losses; Optical refraction; Optical scattering; Optical waveguides; Planar waveguides; Polarization; Rectangular waveguides;
Conference_Titel :
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN :
1-55752-795-4
DOI :
10.1109/CLEO.2005.202116
