DocumentCode
45062
Title
Absorption, Gain, and Threshold in InP/AlGaInP Quantum Dot Laser Diodes
Author
Al-Ghamdi, M.S. ; Smowton, P.M. ; Shutts, S. ; Blood, P. ; Beanland, R. ; Krysa, A.B.
Author_Institution
Dept. of Phys., King Abdulaziz Univ., Jeddah, Saudi Arabia
Volume
49
Issue
4
fYear
2013
fDate
Apr-13
Firstpage
389
Lastpage
394
Abstract
We study self-assembled InP quantum dot (QD) laser structures grown at two temperatures (690°C and 730 °C) each with three different quantities of deposited quantum dot material (2, 2.5, and 3 mono-layers). The absorption spectra of these structures show features associated with the QD distributions and the magnitude of the absorption increases for samples where more material is deposited and for lower growth temperature. The 690°C growth temperature structures exhibit nonradiative recombination and internal optical mode loss that increase with the quantity of material deposited; we suggest that the laser performance is limited by the presence of defects. The higher growth temperature samples have lower threshold current density and are limited by gain saturation. For these samples and for 2-mm long lasers with uncoated facets, the threshold current density is as low as 150 A cm-2, emitting in the wavelength range around 730 nm.
Keywords
III-V semiconductors; MOCVD coatings; electron-hole recombination; indium compounds; light absorption; monolayers; optical losses; optical materials; quantum dot lasers; self-assembly; visible spectra; InP-AlGaInP; absorption spectra; internal optical mode loss; laser performance; lasing threshold; nonradiative recombination; quantum dot laser diode; self-assembled quantum dot laser structures; temperature 690 C; temperature 730 C; Absorption; Materials; Optical losses; Quantum dot lasers; Spontaneous emission; Temperature measurement; Threshold current; Optical losses; quantum dot (QD) devices; semiconductor laser; spontaneous emission;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2013.2245496
Filename
6451098
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